Forthcoming: Fundamentals of Atomic Force Microscopy

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Lessons from Nanoscience: A Lecture Notes Series: Volume 4 Fundamentals of Atomic Force Microscopy Part I: Foundations by Ronald Reifenberger (Purdue University, USA) Apply this discount code to enjoy 20% off Discount Code: WSMAR20 | till 20 March 2015 softcover: US$48 / £32 / S$62 US$38.40 / £25.60 / S$49.60 hardcover: US$115 / £76 / S$148 US$92 / £60.80 / S$118.40 The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. You may also be interested in: Essential Physics of Nanoscale Transistors Nanoscience and Technology A Collection of Reviews from Nature Journals Scanning Probe Microscopy Techniques in Microscopy for Biomedical Applications